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1 laser-induced current
Engineering: LICУниверсальный русско-английский словарь > laser-induced current
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2 laser-beam-induced current
Optics: LBICУниверсальный русско-английский словарь > laser-beam-induced current
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3 LIC
laser-induced current — ток, возбуждённый лазером -
4 ток, возбуждаемый лазером
Engineering: laser-induced currentУниверсальный русско-английский словарь > ток, возбуждаемый лазером
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5 ток, наведённый лазерным излучением
Microelectronics: laser-beam induced currentУниверсальный русско-английский словарь > ток, наведённый лазерным излучением
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6 пересекать
•The time required for the flame front to cross the combustion space...
•This tangent cuts (or intersects) the axis at the point .
•The current in the rotor of an induction motor is induced as the rotor conductors cut lines of magnetic flux created by the stator.
•If the bisector does not meet DE, they are parallel.
•A laser beam intersects a beam of sodium atoms from...
Русско-английский научно-технический словарь переводчика > пересекать
См. также в других словарях:
Optical beam induced current — (OBIC) is a semiconductor analysis technique performed using laser signal injection. The technique uses a scanning laser beam to create electron–hole pairs in a semiconductor sample. This induces a current which may be analyzed to determine the… … Wikipedia
Laser — For other uses, see Laser (disambiguation). United States Air Force laser experiment … Wikipedia
Laser diode — Top: a packaged laser diode shown with a penny for scale. Bottom: the laser diode chip is removed from the above package and placed on the eye of a needle for scale … Wikipedia
Nd:YAG laser — with lid open showing frequency doubled 532 nm green light Nd:YAG laser rod … Wikipedia
Laboratory for Laser Energetics — LLE redirects here. For other uses, see LLE (disambiguation). Laboratory for Laser Energetics Motto A unique national resource … Wikipedia
Optical beam-induced currents — Optical Beam Induced Current (OBIC) is a semiconductor analysis technique that employs a scanning laser beam to induce a current flow within a semiconductor sample which may be collected and analyzed to generate images that represent the sample s … Wikipedia
Thermal laser stimulation — represents a class of defect imaging techniques which employ a laser to produce a thermal variation in a semiconductor device. [Harvnb|Beaudoin|Desplats|Perdue|Boit|2004] This technique may be used for semiconductor failure analysis. There are… … Wikipedia
Distributed feedback laser — A distributed feedback laser (DFB) is a type of laser diode, quantum cascade laser or optical fibre laser where the active region of the device is periodically structured as a diffraction grating. The structure builds a one dimensional… … Wikipedia
Electromagnetically induced transparency — The effect of EIT on a typical absorption line. A weak probe normally experiences absorption shown in blue. A second coupling beam induces EIT and creates a window in the absorption region (red). This plot is a computer simulation of EIT in an… … Wikipedia
Light induced voltage alteration — (LIVA) is a semiconductor analysis technique that uses a laser or infrared light source to induce voltage changes in a device while scanning the beam of light across its surface. The technique relies upon the generation of electron hole pairs in… … Wikipedia
Lightning — This article is about the atmospheric electrical phenomenon. For other uses, see Lightning (disambiguation). See also: Lightning strike Lightning striking Atlanta, United States Lightning is an atmospheric electrostatic discharge (spar … Wikipedia
